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		Construction and uncertainty evaluation of a calibration system for GPS receivers / T.K. Yeh ... [et al.] by Yeh, T. K. Source: MetrologiaMaterial type: Article; Format: print Online access: Click here to access online Availability: No items available. Add to cart (remove)
		Atomic force microscope cantilever calibration device for quantified force metrology at micro- or nano-scale regime: the nano force calibrator (NFC) / Min-Seok Kim ... [et al.] by Kim, Min-Seok. Source: MetrologiaMaterial type: Article; Format: print Online access: Click here to access online Availability: No items available. Add to cart (remove)
		Analytical applications of second-order calibration methods / Veronica Gomez and Maria Pilar Callao by Gomez, Veronica \| Callao, Maria Pilar. Source: Analytica Chimica ActaMaterial type: Article; Format: print Availability: No items available. Add to cart (remove)
		Improvement of direct calibration in spectroscopy / Jean-Claude Boulet and Jean-Michel Roger by Boulet, Jean-Claude \| Roger, Jean-Michel. Source: Analytica Chimica ActaMaterial type: Article; Format: print Availability: No items available. Add to cart (remove)
		Least squares in calibration : dealing with uncertainty in x / Joel Tellinghuisen by Tellinghuisen, Joel. Source: AnalystMaterial type: Article; Format: print Availability: No items available. Add to cart (remove)
		New methods applicable for calibration of indicator electrodes / Tadeusz Michalowski ...[et al.] by Michalowski, Tadeusz. Source: TalantaMaterial type: Article; Format: print Availability: No items available. Add to cart (remove)
		A review on second-and third-order multivariate calibration applied to chromatographic data / Juan A. Arancibia ...[et al.] by Arancibia, Juan A. Source: Journal of Chromatography BMaterial type: Article; Format: print Availability: No items available. Add to cart (remove)